Nanoscale Structures of Materials and Chirality of Optical Near-Field
نویسندگان
چکیده
منابع مشابه
An overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
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چکیده ندارد.
15 صفحه اولNear-Field Optical Characterization of Nanocomposite Materials
*We present a near-field optical technique *-hich makes use of the strongly enhanced optical field at a laser-illuminated metal tip. The enhanced field is used to locally excite the sample under investigation by multiphoton absorption. An optical scan image w-ith spatial resolutions dow-n to 20 nm is established by detecting the emitted fluorescence. The principle of the method is described and...
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We present an analytic derivation for the enhancement of local optical chirality in the near field of plasmonic nanostructures by tuning the far-field polarization of external light. We illustrate the results by means of simulations with an achiral and a chiral nanostructure assembly and demonstrate that local optical chirality is significantly enhanced with respect to circular polarization in ...
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ژورنال
عنوان ژورنال: The Review of Laser Engineering
سال: 2018
ISSN: 0387-0200,1349-6603
DOI: 10.2184/lsj.46.4_187